| 000 | 01327cam a2200325 a 4500 | ||
|---|---|---|---|
| 001 | 45064 | ||
| 003 | BD-DhNLB | ||
| 005 | 20230802100829.0 | ||
| 008 | 981112s1999 maua b 001 0 eng | ||
| 010 | _a 98051769 | ||
| 020 | _a0412145618 (acidfree paper) | ||
| 040 |
_aDLC _cDLC _dDLC |
||
| 050 | 0 | 0 |
_aTK7871.852 _b.F35 1999 |
| 082 | 0 | 0 |
_a621.3815 _221 |
| 245 | 0 | 0 |
_aFailure analysis of integrated circuits : _btools and techniques / |
| 260 |
_aBoston, Mass. : _bKluwer Academic Publishers, _cc1999. |
||
| 300 |
_aix, 255 p. : _bill. ; _c25 cm. |
||
| 500 | _a"SECS 494"--P. [4] of cover. | ||
| 504 | _aIncludes bibliographical references and index. | ||
| 650 | 0 |
_aSemiconductors _xFailures. _939924 |
|
| 650 | 0 |
_aIntegrated circuits _xTesting. _939925 |
|
| 650 | 0 |
_aIntegrated circuits _xReliability. _939926 |
|
| 700 | 1 |
_aWagner, Lawrence C. _939927 |
|
| 856 | 4 | 2 |
_3Publisher description _uhttp://www.loc.gov/catdir/enhancements/fy0821/98051769-d.html |
| 856 | 4 | 1 |
_3Table of contents only _uhttp://www.loc.gov/catdir/enhancements/fy0821/98051769-t.html |
| 906 |
_a7 _bcbu _corignew _d1 _eocip _f19 _gy-gencatlg |
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| 942 |
_2ddc _n0 _cBK |
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| 999 |
_c45064 _d45064 |
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