TY  - BOOK
AU  - Wagner,Lawrence C.
TI  - Failure analysis of integrated circuits: tools and techniques 
SN  - 0412145618 (acidfree paper)
AV  - TK7871.852 .F35 1999
U1  - 621.3815 21
PY  - 1999///
CY  - Boston, Mass.
PB  - Kluwer Academic Publishers
KW  - Semiconductors
KW  - Failures
KW  - Integrated circuits
KW  - Testing
KW  - Reliability
N1  - "SECS 494"--P. [4] of cover; Includes bibliographical references and index
UR  - http://www.loc.gov/catdir/enhancements/fy0821/98051769-d.html
UR  - http://www.loc.gov/catdir/enhancements/fy0821/98051769-t.html
ER  -