Failure analysis of integrated circuits :  tools and techniques / 

 - Boston, Mass. :  Kluwer Academic Publishers,  c1999. 
 - ix, 255 p. :  ill. ;  25 cm. 
<br/><br/> "SECS 494"--P. [4] of cover. 
<br/><br/>Includes bibliographical references and index. 
<br/><br/><label>ISBN: </label>0412145618 (acidfree paper) 
<br/><br/><label>LCCN: </label>98051769  
<br/><br/><label>Subjects--Topical Terms: </label><br/>Semiconductors--Failures.<br/>Integrated circuits--Testing.<br/>Integrated circuits--Reliability.
<br/><br/><label>LC Class. No.: </label>TK7871.852  / .F35 1999 
<br/><br/><label>Dewey Class. No.: </label>621.3815